Dhaka 7th Feb.,’14. In  an article titled, “Towards the discovery of the  novel genetic component involved in stress resistance in Arabidopsis thaliana,” published in the February issue of New Phytologist (201:810-824) M. Juraniec and nine of his associates at the Laboratory of Plant Physiology and Molecular Genetics at the Universite Libre de Bruxelles Brussels, Belgium describe the characteristics  of  some easy and suitable markers for screening mutants of Arabidopsis thaliana altered in their response to copper excess. They observed that the exposure of plants to high concentrations of trace metallic elements of copper involves a remodeling of the root system, characterized by a primary root growth inhibition with a concomitant increase in the lateral root density.